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<?xml-stylesheet type="text/xsl" href="https://devzone.nordicsemi.com/cfs-file/__key/system/syndication/rss.xsl" media="screen"?><rss version="2.0" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:slash="http://purl.org/rss/1.0/modules/slash/" xmlns:wfw="http://wellformedweb.org/CommentAPI/" xmlns:atom="http://www.w3.org/2005/Atom"><channel><title>loopback test mode</title><link>https://devzone.nordicsemi.com/f/nordic-q-a/10004/loopback-test-mode</link><description>The manual for my Agilent N4010A Wireless Test Set talks about a BER test based on a &amp;quot;vendor specific loopback test mode&amp;quot;. This mode would allow me to do BER measurements without connecting to the DUT with a cable. Is there Nordic-supplied loopback code</description><dc:language>en-US</dc:language><generator>Telligent Community 13</generator><lastBuildDate>Tue, 03 Nov 2015 19:34:47 GMT</lastBuildDate><atom:link rel="self" type="application/rss+xml" href="https://devzone.nordicsemi.com/f/nordic-q-a/10004/loopback-test-mode" /><item><title>RE: loopback test mode</title><link>https://devzone.nordicsemi.com/thread/37066?ContentTypeID=1</link><pubDate>Tue, 03 Nov 2015 19:34:47 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:846c1df8-7485-45af-9a74-0a8d9acbe966</guid><dc:creator>Bret Foreman</dc:creator><description>&lt;p&gt;To explain a little more, the UART-based DTM will be fine for manufacturing test. But my application use-case does not allow a wired connection and I need to correlate the application performance to the manufacturing tests. So I need a wireless loop-back to do that correlation.&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item></channel></rss>