ADC measurement results change when switching from debug to release

RE: ADC measurement results change when switching from debug to release

Sigurd — Mon, 27 May 2024 17:40:46 GMT

[quote user="MartinZ"]Yes, it does disappear.[/quote]

Sounds like the compiler is doing some optimization on the 'vin' variable then. Try declaring it as volatile.

Change

uint32_t vin = p_event->data.done.p_buffer[0]; // vin = Digits * Reference / Gain / 2^resolution

volatile uint32_t vin = p_event->data.done.p_buffer[0]; // vin = Digits * Reference / Gain / 2^resolution

RE: ADC measurement results change when switching from debug to release

MartinZ — Sun, 26 May 2024 10:55:29 GMT

Yes, it does disappear. I used this as a "fix" in the meantime, but it's not very reassuring. I started to ask myself what else might break when switching from debug to release build, without being noticed.

RE: ADC measurement results change when switching from debug to release

Sigurd — Fri, 24 May 2024 08:25:24 GMT

If you take your project, and change the release configuration from "Optimize for Size", to None. Does the issue disappear?

RE: ADC measurement results change when switching from debug to release

MartinZ — Thu, 16 May 2024 16:28:31 GMT

It's a custom board, I don't have a DK for this MCU. But we've done another project on this same board before, and there, voltage measurement was working fine both in debug and release mode.

RE: ADC measurement results change when switching from debug to release

Sigurd — Thu, 16 May 2024 15:10:32 GMT

Hi!

Is this issue observed on a custom board? Do you see the same on the DK?