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<?xml-stylesheet type="text/xsl" href="https://devzone.nordicsemi.com/cfs-file/__key/system/syndication/rss.xsl" media="screen"?><rss version="2.0" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:slash="http://purl.org/rss/1.0/modules/slash/" xmlns:wfw="http://wellformedweb.org/CommentAPI/" xmlns:atom="http://www.w3.org/2005/Atom"><channel><title>Problems with RF Frequency Bias Calibration</title><link>https://devzone.nordicsemi.com/f/nordic-q-a/111754/problems-with-rf-frequency-bias-calibration</link><description>I would like to understand the issue of frequency offset calibration in RF signals, I have viewed the 
 
 Case ID: 309794 
 nwp_006.pdf 
 
 I would like to know if I can do a frequency bias calibration by adjusting the load capacitors inside the chip</description><dc:language>en-US</dc:language><generator>Telligent Community 13</generator><lastBuildDate>Wed, 05 Jun 2024 14:44:04 GMT</lastBuildDate><atom:link rel="self" type="application/rss+xml" href="https://devzone.nordicsemi.com/f/nordic-q-a/111754/problems-with-rf-frequency-bias-calibration" /><item><title>RE: Problems with RF Frequency Bias Calibration</title><link>https://devzone.nordicsemi.com/thread/487554?ContentTypeID=1</link><pubDate>Wed, 05 Jun 2024 14:44:04 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:c99edb36-9942-48a2-b74d-49d8296f5ee4</guid><dc:creator>ketiljo</dc:creator><description>&lt;p&gt;You don&amp;#39;t have to do production trimming. This is a one time design config.&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: Problems with RF Frequency Bias Calibration</title><link>https://devzone.nordicsemi.com/thread/487394?ContentTypeID=1</link><pubDate>Wed, 05 Jun 2024 01:25:23 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:6bd07d4c-53c3-4d10-9f99-8ae76a45d1dd</guid><dc:creator>emmovo</dc:creator><description>&lt;p&gt;If I want to perform frequency offset calibration in production test, based on the actual measured frequency offset value of each piece of dut in conjunction with the production test firmware, how should I implement this calibration action in my production test firmware; and is there any other method other than the one configured by kconfig?&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: Problems with RF Frequency Bias Calibration</title><link>https://devzone.nordicsemi.com/thread/487268?ContentTypeID=1</link><pubDate>Tue, 04 Jun 2024 10:25:36 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:cd867f96-869c-4680-a7fa-dd8d0be312e5</guid><dc:creator>ketiljo</dc:creator><description>&lt;p&gt;You set this in Kconfig:&lt;/p&gt;
&lt;p&gt;&lt;a href="https://developer.nordicsemi.com/nRF_Connect_SDK/doc/latest/kconfig/index.html#CONFIG_SOC_HFXO_CAP_INT_VALUE_X2"&gt;https://developer.nordicsemi.com/nRF_Connect_SDK/doc/latest/kconfig/index.html#CONFIG_SOC_HFXO_CAP_INT_VALUE_X2&lt;/a&gt;&lt;/p&gt;
&lt;p&gt;Select the capacitor value as you would with external caps: Ccap = CL * 2 - 2.5 pF&lt;/p&gt;
&lt;p&gt;The Kconfig is set to double this value&lt;/p&gt;
&lt;p&gt;&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item></channel></rss>