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<?xml-stylesheet type="text/xsl" href="https://devzone.nordicsemi.com/cfs-file/__key/system/syndication/rss.xsl" media="screen"?><rss version="2.0" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:slash="http://purl.org/rss/1.0/modules/slash/" xmlns:wfw="http://wellformedweb.org/CommentAPI/" xmlns:atom="http://www.w3.org/2005/Atom"><channel><title>How to best integrate DTM sample in NRF53 application?</title><link>https://devzone.nordicsemi.com/f/nordic-q-a/117214/how-to-best-integrate-dtm-sample-in-nrf53-application</link><description>Hi, 
 I am quite new to nrf&amp;#39;s and zephyr and I&amp;#39;m working on a product that requires Direct Test Mode functionality. I started with the DTM sample and am now looking at how it can be integrated into our application running on an nrf5340 but have found</description><dc:language>en-US</dc:language><generator>Telligent Community 13</generator><lastBuildDate>Thu, 16 Oct 2025 11:47:33 GMT</lastBuildDate><atom:link rel="self" type="application/rss+xml" href="https://devzone.nordicsemi.com/f/nordic-q-a/117214/how-to-best-integrate-dtm-sample-in-nrf53-application" /><item><title>RE: How to best integrate DTM sample in NRF53 application?</title><link>https://devzone.nordicsemi.com/thread/551696?ContentTypeID=1</link><pubDate>Thu, 16 Oct 2025 11:47:33 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:d6ec1c95-bc05-457c-9612-afcb10d541ff</guid><dc:creator>Christopher</dc:creator><description>&lt;p&gt;Is there any update on this? Have dynamic interrupts been implemented?&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: How to best integrate DTM sample in NRF53 application?</title><link>https://devzone.nordicsemi.com/thread/514711?ContentTypeID=1</link><pubDate>Thu, 12 Dec 2024 11:33:10 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:1cf70b54-d927-49ce-a374-eec14c73dade</guid><dc:creator>Sigurd</dc:creator><description>&lt;p&gt;Hi&lt;/p&gt;
&lt;p&gt;As of today, the &lt;span&gt;Direct Test Mode(DTM)&amp;nbsp;&lt;/span&gt;code does not support&amp;nbsp;Dynamic interrupts. This is needed for having it integrated as part of the application. So today, the only supported solution is to have the DTM as a separate hex file that you program to the chip when you want to do DTM testing.&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item></channel></rss>