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<?xml-stylesheet type="text/xsl" href="https://devzone.nordicsemi.com/cfs-file/__key/system/syndication/rss.xsl" media="screen"?><rss version="2.0" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:slash="http://purl.org/rss/1.0/modules/slash/" xmlns:wfw="http://wellformedweb.org/CommentAPI/" xmlns:atom="http://www.w3.org/2005/Atom"><channel><title>Probability of HARD FAULT occurring during the BLE connection process</title><link>https://devzone.nordicsemi.com/f/nordic-q-a/127627/probability-of-hard-fault-occurring-during-the-ble-connection-process</link><description>Hi all, 
 During the Bluetooth connection process, there is a small probability of the following phenomena occurring (both of which are the same firmware, with the similarity being that I2C will read data every 50ms at this time. I don&amp;#39;t know if this</description><dc:language>en-US</dc:language><generator>Telligent Community 13</generator><lastBuildDate>Thu, 09 Apr 2026 04:05:48 GMT</lastBuildDate><atom:link rel="self" type="application/rss+xml" href="https://devzone.nordicsemi.com/f/nordic-q-a/127627/probability-of-hard-fault-occurring-during-the-ble-connection-process" /><item><title>RE: Probability of HARD FAULT occurring during the BLE connection process</title><link>https://devzone.nordicsemi.com/thread/564668?ContentTypeID=1</link><pubDate>Thu, 09 Apr 2026 04:05:48 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:539335c5-b035-45e6-975f-a64446f12a21</guid><dc:creator>666</dc:creator><description>&lt;p&gt;HI&lt;/p&gt;
&lt;p&gt;&amp;nbsp; &amp;nbsp;We are using&amp;nbsp;&lt;span&gt;nrfx_twim_init&lt;/span&gt;(...),&amp;nbsp; where the interrupt priority is NRFX_TWIM_DEFAULT_CONFIG_IRQ_PRIORITY(7). Is it possible that this priority is too high and may affect &lt;span&gt;MPSL init ?&lt;/span&gt;&lt;/p&gt;
&lt;p&gt;&lt;span&gt;&amp;nbsp; &amp;nbsp; Very urgent, looking forward to your advice！&lt;/span&gt;&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: Probability of HARD FAULT occurring during the BLE connection process</title><link>https://devzone.nordicsemi.com/thread/564461?ContentTypeID=1</link><pubDate>Tue, 07 Apr 2026 01:08:36 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:377bb868-2334-4642-8d20-ad0154115b1f</guid><dc:creator>666</dc:creator><description>&lt;p&gt;Hi&lt;/p&gt;
&lt;p&gt;&amp;nbsp; Because the reading function of I2C cannot be changed, I would like to solve this problem from other aspects. Do you have any good suggestions?&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: Probability of HARD FAULT occurring during the BLE connection process</title><link>https://devzone.nordicsemi.com/thread/564404?ContentTypeID=1</link><pubDate>Thu, 02 Apr 2026 01:12:03 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:41ac071a-32fd-47c5-bc97-b869058d029c</guid><dc:creator>666</dc:creator><description>&lt;p&gt;Hi&lt;/p&gt;
&lt;p&gt;Random and with a low probability.When will &lt;span&gt;MPSL init&amp;nbsp;&lt;/span&gt;? The above phenomenon occurs during the communication process after Bluetooth connection.Why does I2C read affect it? Is it due to priority reasons&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: Probability of HARD FAULT occurring during the BLE connection process</title><link>https://devzone.nordicsemi.com/thread/564278?ContentTypeID=1</link><pubDate>Tue, 31 Mar 2026 05:36:53 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:3c1f9c3a-2393-44b7-a396-78b1ed750499</guid><dc:creator>Simonr</dc:creator><description>&lt;p&gt;Hi&lt;/p&gt;
&lt;p&gt;When does the phenomena 1 occur versus phenomena 2? Or is it seemingly random that either of these occur. I think the MPSL init assert can be caused by the I2C reading data very often when the MPSL is trying to init.&lt;/p&gt;
&lt;p&gt;Best regards,&lt;/p&gt;
&lt;p&gt;Simon&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item></channel></rss>