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<?xml-stylesheet type="text/xsl" href="https://devzone.nordicsemi.com/cfs-file/__key/system/syndication/rss.xsl" media="screen"?><rss version="2.0" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:slash="http://purl.org/rss/1.0/modules/slash/" xmlns:wfw="http://wellformedweb.org/CommentAPI/" xmlns:atom="http://www.w3.org/2005/Atom"><channel><title>nRF52832 SAADC error versus temperature</title><link>https://devzone.nordicsemi.com/f/nordic-q-a/17305/nrf52832-saadc-error-versus-temperature</link><description>I&amp;#39;m using the SAADC of an nRF52832. I&amp;#39;d like to reduce the error of my measurements from the nominal +/-3%. I&amp;#39;m calling the NRF_SAADC_TASK_CALIBRATEOFFSET periodically to reduce errors, but I do still measure errors that are in the range of +/-3%. Generally</description><dc:language>en-US</dc:language><generator>Telligent Community 13</generator><lastBuildDate>Thu, 27 Oct 2016 07:10:14 GMT</lastBuildDate><atom:link rel="self" type="application/rss+xml" href="https://devzone.nordicsemi.com/f/nordic-q-a/17305/nrf52832-saadc-error-versus-temperature" /><item><title>RE: nRF52832 SAADC error versus temperature</title><link>https://devzone.nordicsemi.com/thread/66497?ContentTypeID=1</link><pubDate>Thu, 27 Oct 2016 07:10:14 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:ada3acab-95e9-4674-9409-48e541a352e5</guid><dc:creator>J&amp;#248;rgen Holmefjord</dc:creator><description>&lt;p&gt;Hi Paul, the INL and DNL descriptions found in the &lt;a href="http://infocenter.nordicsemi.com/topic/com.nordic.infocenter.nrf52832.ps.v1.1/saadc.html?cp=2_2_0_36_11_0#unique_978991381"&gt;SAADC Electrical Specification&lt;/a&gt; should describe the non-linear properties of the SAADC over the voltage range. You need to periodically run the offset calibration task whenever there is major temperature change. This can either be done periodically, e.g. every few seconds, or you can measure the temperature on the die with the TEMP peripheral sensor and calibrate only if there is major temperature change. Gain error as result of temperature change is given in the above linked electrical specificaiton as parameter C_EG. If you make sure you enable the external 16MHz crystal before sampling, this should not vary with time.&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF52832 SAADC error versus temperature</title><link>https://devzone.nordicsemi.com/thread/66496?ContentTypeID=1</link><pubDate>Tue, 25 Oct 2016 14:14:25 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:26809d1f-70dd-4b72-9f69-ff155219f8d5</guid><dc:creator>Paul Dunn</dc:creator><description>&lt;p&gt;Jorgen - Thanks for the response. Yes, my method is similar to the link you provided. I am already using an external capacitor and running the offset calibration. And yes, I understand I need to perform both the offset calibration periodically and my 2 point calibration for every part.&lt;/p&gt;
&lt;p&gt;My question is this: If I do this 2 point calibration on every part, how stable will it be over my voltage range, temperature, and time? Will the error be a function of component lot? I&amp;#39;m going to characterize this error over my voltage and temperature range for a small number of parts, but I am concerned that all parts are from the same lot and this error might be a function of component lot. I don&amp;#39;t want to &amp;quot;get lucky&amp;quot; with a good lot of parts, and later find out that even the calibrated error can change, more than I expect, over temperature or time.&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF52832 SAADC error versus temperature</title><link>https://devzone.nordicsemi.com/thread/66495?ContentTypeID=1</link><pubDate>Tue, 25 Oct 2016 12:16:32 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:ee4cb01a-e11b-4274-b4a8-e919afb351f8</guid><dc:creator>J&amp;#248;rgen Holmefjord</dc:creator><description>&lt;p&gt;Hi,&lt;/p&gt;
&lt;p&gt;It looks like your calibration method is similar to the one described in &lt;a href="https://devzone.nordicsemi.com/question/21653/how-to-calibrate-the-nrf51-adc-to-correct-offset-and-gain-error/?answer=21654#post-id-21654"&gt;this answer&lt;/a&gt;. There will be some deviation from device to device, so you will have to calibrate the SAADC for every device to get the reduced error you want.&lt;/p&gt;
&lt;p&gt;If you want to make the SAADC output more stable then you could enable oversampling, or connect a capacitor to reduce noise, description on &lt;a href="https://devzone.nordicsemi.com/blogs/943/measuring-lithium-battery-voltage-with-nrf52/"&gt;this blog&lt;/a&gt;. Offset calibration is also recommended. Oversampling and offset calibration is &lt;a href="https://github.com/NordicSemiconductor/nRF52-ADC-examples/tree/master/saadc_low_power"&gt;coded here&lt;/a&gt;.&lt;/p&gt;
&lt;p&gt;Best regards,&lt;/p&gt;
&lt;p&gt;Jørgen&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item></channel></rss>