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<?xml-stylesheet type="text/xsl" href="https://devzone.nordicsemi.com/cfs-file/__key/system/syndication/rss.xsl" media="screen"?><rss version="2.0" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:slash="http://purl.org/rss/1.0/modules/slash/" xmlns:wfw="http://wellformedweb.org/CommentAPI/" xmlns:atom="http://www.w3.org/2005/Atom"><channel><title>Deterministic test vector-based tests of ECDSA with CC310</title><link>https://devzone.nordicsemi.com/f/nordic-q-a/42342/deterministic-test-vector-based-tests-of-ecdsa-with-cc310</link><description>Hi, 
 we use CC310 (in nRF52840) in a project (working directly with the CRYS API from SDK 15.2.0). When doing a test of ECDSA with secp256r1, following the one given within the SDK (Load keys-&amp;gt;Sign-&amp;gt;Verify), everything works well. However, we would also</description><dc:language>en-US</dc:language><generator>Telligent Community 13</generator><lastBuildDate>Thu, 10 Jan 2019 12:07:30 GMT</lastBuildDate><atom:link rel="self" type="application/rss+xml" href="https://devzone.nordicsemi.com/f/nordic-q-a/42342/deterministic-test-vector-based-tests-of-ecdsa-with-cc310" /><item><title>RE: Deterministic test vector-based tests of ECDSA with CC310</title><link>https://devzone.nordicsemi.com/thread/164893?ContentTypeID=1</link><pubDate>Thu, 10 Jan 2019 12:07:30 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:aaf84cba-bca9-495c-a4c8-0b8f36081422</guid><dc:creator>DamianV</dc:creator><description>&lt;p&gt;Hi Einar,&lt;/p&gt;
&lt;p&gt;thanks for your reply.&lt;/p&gt;
&lt;p&gt;&amp;gt; &amp;quot;The random number may be modified internally in the CC310 runtime library if the generated number is of bad quality&amp;quot;&lt;/p&gt;
&lt;p&gt;Does this mean, that the runtime library can further modify the output of the RNG_GenerateVector function? Is there no test mode for the RNG?&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: Deterministic test vector-based tests of ECDSA with CC310</title><link>https://devzone.nordicsemi.com/thread/164888?ContentTypeID=1</link><pubDate>Thu, 10 Jan 2019 11:52:00 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:e8193070-df7c-4c24-9d6f-2e048880db30</guid><dc:creator>Einar Thorsrud</dc:creator><description>&lt;p&gt;Hi,&lt;/p&gt;
&lt;p&gt;Testing key generation is not straightforward. The random number may be modified internally in the CC310 runtime library if the generated number is of bad quality, folliwing the specification in&amp;nbsp;FIPS 186-4: B.1.2, B.4.2 etc. (If this is the case I expect you should see there are additional calls to the dummy RNG function you provided).&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item></channel></rss>