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<?xml-stylesheet type="text/xsl" href="https://devzone.nordicsemi.com/cfs-file/__key/system/syndication/rss.xsl" media="screen"?><rss version="2.0" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:slash="http://purl.org/rss/1.0/modules/slash/" xmlns:wfw="http://wellformedweb.org/CommentAPI/" xmlns:atom="http://www.w3.org/2005/Atom"><channel><title>nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/f/nordic-q-a/5997/nrf51822-temp-internal-temperature-sensor-characteristic</link><description>I&amp;#39;m trying to use the internal temperature sensor of the nRF51 to know the die temperature. Its accuracy is specced as +/- 4 degC, even +/- 8 degC at the extremes. Does anyone know more properties of this uncertainty? Is it a fixed thing, that I can improve</description><dc:language>en-US</dc:language><generator>Telligent Community 13</generator><lastBuildDate>Wed, 25 Mar 2015 16:30:24 GMT</lastBuildDate><atom:link rel="self" type="application/rss+xml" href="https://devzone.nordicsemi.com/f/nordic-q-a/5997/nrf51822-temp-internal-temperature-sensor-characteristic" /><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20932?ContentTypeID=1</link><pubDate>Wed, 25 Mar 2015 16:30:24 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:d002b6bf-d12f-4d0d-80fc-0bf1713f67a3</guid><dc:creator>Bouke</dc:creator><description>&lt;p&gt;I did a repeat experiment, this time with each device sleeping for 20 seconds, then doing a measurement immediately after wakeup, and then communicating that data. The results look similar, but this time (same hardware) the offset is smaller, between 6 and 12 degrees. So perhaps the difference is caused by the die temperature after all...&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20931?ContentTypeID=1</link><pubDate>Wed, 25 Mar 2015 08:30:47 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:8f02ef35-d884-454f-a4d1-302e3ce72eab</guid><dc:creator>Bouke</dc:creator><description>&lt;p&gt;QFABB0 - 1405AN; all four of them.&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20930?ContentTypeID=1</link><pubDate>Wed, 25 Mar 2015 08:05:22 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:271a7943-7e28-44a1-8969-5819a6ceb2d2</guid><dc:creator>Susheel Nuguru</dc:creator><description>&lt;p&gt;What hardware are you using Bouke?
earlier versions had a minor glitch with calibrating the TEMP sensor at factory for very very small number of devices (maybe the reason the 4th device is little off with the the other three), but that has been handled for newer hardware. Hopefully you will not see the difference in offsets with newer builds.&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20929?ContentTypeID=1</link><pubDate>Wed, 25 Mar 2015 08:00:22 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:a33341f0-2c25-4377-9e0f-427751a8df46</guid><dc:creator>Bouke</dc:creator><description>&lt;p&gt;I mean to say that I would think a very cold die would have a smaller temp difference with its environment (since it gets cooled a lot), and a hot die would have a larger temperature difference since it loses less heat to the environment. There is no such effect in my measurements. EDIT: After talking to a hardware engineer, I understand that this is not how ICs work, but that there is a constant number of degrees per watt between environmental end die. The following point still holds though:
Furthermore, if those 13 degrees are caused by the CPU heating the die, how would we explain the fact that out of 4 devices (identical hardware, identical software), 3 have about 13 degrees offset, and 1 has 9 degrees? While all devices respond very similar to external influences like sudden temperature changes?&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20928?ContentTypeID=1</link><pubDate>Wed, 25 Mar 2015 07:19:55 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:7f39a246-b61b-4c39-8d7e-6475a3269ca9</guid><dc:creator>Susheel Nuguru</dc:creator><description>&lt;p&gt;&amp;quot;what surprises me most is that it is fairly constant over the whole temperature range&amp;quot;
what do you mean by this? you mean that the temperature of die remained fairly constant at the whole tested temperature range? looking at your chart it seemed that the die temperature was varying accordingly. Also the thermal conductivity of chip is another charecteristics which neccessarily is not linear with outside temperature.&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20939?ContentTypeID=1</link><pubDate>Tue, 24 Mar 2015 16:18:45 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:747eb786-f0c3-4479-a7da-a52c55d3b67b</guid><dc:creator>Bouke</dc:creator><description>&lt;p&gt;Wow, that sounds like a really nice setup! Unfortunately this is not viable in my case...&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20938?ContentTypeID=1</link><pubDate>Tue, 24 Mar 2015 15:50:09 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:b65da1e2-2045-411c-9ae2-4146ee3041c7</guid><dc:creator>Albert Proust</dc:creator><description>&lt;p&gt;In fact is not a fixed value, unfortunately! We use our  reflow oven to have an exact temperature (24°C) and we set via bluetooth the offset value between the oven&amp;#39;s temperature and the internal temp sensor. It&amp;#39;s a bit tricky  but that&amp;#39;s work.&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20927?ContentTypeID=1</link><pubDate>Tue, 24 Mar 2015 14:37:53 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:f0ab23f5-dadc-4922-b1a9-a359dab68a32</guid><dc:creator>Bouke</dc:creator><description>&lt;p&gt;Hi Aryan, a strategy similar to this was implemented, although some communication takes place right before the measurement. I would expect (and accept) perhaps a slightly higher die temperature, but what surprises me most is that it is fairly constant over the whole temperature range. If the environmental temperature is -15 degrees, the chip would lose its heat very easily, and in a 35 degrees environment it would be much warmer. However, there is no such effect; the difference is very similar over the whole temperature range.&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20925?ContentTypeID=1</link><pubDate>Tue, 24 Mar 2015 12:31:57 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:c86a2e27-03d8-475b-865c-22dd5c767024</guid><dc:creator>Susheel Nuguru</dc:creator><description>&lt;p&gt;Bouke, we still have to consider that the external temperature sensor measurement is still not the same as the internal sensor measuring die temperature. The specced accuracy calculations was made specific to the die temperature at a very large variations of temperature it is working in.
How much of the time is the system kept on? maybe we can get a better result by trying to keep the chip in sleep mode most of the time (like a minute) and just wakeup to read the temperature very fast and go back to sleep. That COULD ensure that the die temperature is much closer to outside temperature and then we can use the external temp sensor reading to compare.&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20937?ContentTypeID=1</link><pubDate>Tue, 24 Mar 2015 12:16:10 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:faa57c8a-2fa1-460a-b6df-2f82a2b669cd</guid><dc:creator>Bouke</dc:creator><description>&lt;p&gt;Thanks for sharing your experience! Is the offset you set of a similar value as the one suggested by my measurements? (-13 degrees)&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20926?ContentTypeID=1</link><pubDate>Tue, 24 Mar 2015 12:14:46 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:e01b2ed0-4b44-44b2-b7d3-0dbb0b12437f</guid><dc:creator>Bouke</dc:creator><description>&lt;p&gt;I excluded the possibility if the HFCLK not running just yet. Is there any possible cause for this large difference between the specced accuracy and the actual accuracy?&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20935?ContentTypeID=1</link><pubDate>Tue, 24 Mar 2015 11:56:08 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:725df036-d97a-469f-a7f8-60027d99ffe4</guid><dc:creator>Susheel Nuguru</dc:creator><description>&lt;p&gt;Yes, I agree. It wont make a difference if the anamoly does not apply to the hardware you have.&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20934?ContentTypeID=1</link><pubDate>Mon, 23 Mar 2015 14:40:13 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:bd3cbbb3-40f0-4432-bc4f-be035383778e</guid><dc:creator>Bouke</dc:creator><description>&lt;p&gt;Hi Aryan, it is mentioned in the Product Anomaly Notice 31: TEMP: Temperature offset value has to be manually loaded to the TEMP module..&lt;/p&gt;
&lt;p&gt;EDIT: On closer inspection I see that this PAN does not apply to the specific build number of my hardware. The TEMP offset register is 0 in any case, so setting it to 0 or not does not make a difference.&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20933?ContentTypeID=1</link><pubDate>Mon, 23 Mar 2015 13:58:08 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:568ac63e-143d-4e58-b75d-a755d8f9c0a2</guid><dc:creator>Susheel Nuguru</dc:creator><description>&lt;p&gt;Hi Bouke,
Which temperature offset register are you talking about?
I dont see any offset register in the documentation I have.&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20942?ContentTypeID=1</link><pubDate>Fri, 13 Mar 2015 08:55:52 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:df75e390-ac35-463e-abc6-80b09d13cfe3</guid><dc:creator>Susheel Nuguru</dc:creator><description>&lt;p&gt;reading multiple readings and taking an average might result in less noisy reading but the average will not deviate too much (like +/-4 C) from single reading. Also note that the noise in result is more as the die is getting closer to one end of its operating temperatures, otherwise you will only see negligle noise (about +/-0.25 C deviation if die is operating at 10-60 C).
Hope this helps&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20936?ContentTypeID=1</link><pubDate>Thu, 12 Mar 2015 15:14:22 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:488e99df-0647-486c-a3fd-72cd48075482</guid><dc:creator>Albert Proust</dc:creator><description>&lt;p&gt;Hello Bouk,&lt;/p&gt;
&lt;p&gt;We use the TEMP sensor and we set an offset. You don&amp;#39;t have any another way, I guess.&lt;/p&gt;
&lt;p&gt;Al&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20924?ContentTypeID=1</link><pubDate>Thu, 12 Mar 2015 14:44:03 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:898712ff-cd99-4e4a-9ec5-0828f2cd6251</guid><dc:creator>Bouke</dc:creator><description>&lt;p&gt;From &lt;a href="https://devzone.nordicsemi.com/question/1009/silicon-die-temperature-value-interpretation/"&gt;this question&lt;/a&gt;, it seems that it is a pure offset:&lt;/p&gt;
&lt;blockquote&gt;
&lt;p&gt;The error read on the TEMP peripheral
should be pure offset error. You can
calibrate the temperature value in
software, i.e. if you know the
temperature in your room, just add or
subtract from the measured value to
get the correct value.&lt;/p&gt;
&lt;/blockquote&gt;
&lt;p&gt;However, be aware that the die temperature is in general not equal to the ambient temperature.&lt;/p&gt;
&lt;p&gt;I did some measurements comparing the internal temperature sensor value with temperature measured by a dedicated temperature sensor (TMP112) on the same PCB, in a controlled environment. Because the application makes very little use of the CPU, I do not expect that it is significantly hotter than the environment.
&lt;img src="https://devzone.nordicsemi.com/cfs-file/__key/communityserver-discussions-components-files/4/Climate_5F00_Chamber_5F00_witherror.png" alt="Plot of temperature and temperature error." /&gt;&lt;/p&gt;
&lt;p&gt;This confirms previously made statements that the noise is low, and the accuracy is mainly distorted by an offset. To my surprise however, this offset is around 13 degrees! When corrected for the average, the accuracy is nicely within the specced +/-4 degrees. Could this large offset have something to do with having to set the temperature offset register to 0?&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20941?ContentTypeID=1</link><pubDate>Thu, 12 Mar 2015 12:52:38 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:e9eb69c6-b3f5-44db-8127-ea72c8dc2234</guid><dc:creator>Bouke</dc:creator><description>&lt;p&gt;Hi Aryan, thanks for the feedback. I understand that I cannot change the sensor or its behaviour. But I am wondering if you have more details on the accuracy of the sensor. Can I process the data afterwards to get more precise results?&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item><item><title>RE: nRF51822 TEMP internal temperature sensor characteristic</title><link>https://devzone.nordicsemi.com/thread/20940?ContentTypeID=1</link><pubDate>Thu, 12 Mar 2015 12:31:44 GMT</pubDate><guid isPermaLink="false">137ad170-7792-4731-bb38-c0d22fbe4515:703e6308-ecd6-4b70-9c4a-07c0d85ca4ec</guid><dc:creator>Susheel Nuguru</dc:creator><description>&lt;p&gt;Hi,&lt;/p&gt;
&lt;p&gt;The TEMP sensor is calibrated during production and there is nothing much that can be done to change its behaviour thereafter.&lt;/p&gt;
&lt;p&gt;/Aryan&lt;/p&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;</description></item></channel></rss>