https://devzone.nordicsemi.com/f/nordic-q-a/87659/missing-softdevice-after-cold-temperature-test-of-100-hoursHi, I am using nRF52805 microcontroller in our product, that need to pass some tests, one of them is Low Temperature Test , We flashed softdevice and application code and sent it for cold Temperature Test. And we observed these below points after testen-USTelligent Community 13Mon, 09 May 2022 12:44:01 GMThttps://devzone.nordicsemi.com/thread/366937?ContentTypeID=1Mon, 09 May 2022 12:44:01 GMT137ad170-7792-4731-bb38-c0d22fbe4515:4c9d79e3-44a0-482c-94ec-3d6975500777Kenneth<p>Hello,</p> <p>I checked with our QA department to check if this is something they have seen before, and this is not something they have seen before.&nbsp;</p> <p>It&#39;s the same flash block that hold both the applicaiton and softdevice, so there are conseptually no reason why one should be contained while the other is erased. I think the problem is related to the application was not programmed and verified before temperature&nbsp;test. I suggest to program, verify, do a hard reset to exit debug mode, do a functional test, and then repeat the temperature test.</p> <p>Best regards,<br />Kenneth</p><div style="clear:both;"></div>