Hello,
I am currently working in a wearable device based on the nRF5340. We have a few Audio DKs and I am using them as a hardware design reference.
I have a question about the ERR and CHG pin test points in the nPM1100. You have decided to use a test point in PMOS sources with ERR and CHG signals in their gates while ground is on the drain. If no voltage is on the source, the MOS is cut and no signal must appear on the test point. The only scenario I can think of were you can actually measure something in the points might be when applying a voltage and measuring the presence of current - If ERR or CHG are active (as they are active low), and there is a voltage greater than the overdrive voltage for the given MOS you should measure considerable current. Thus maybe it is there for a continuity check with a multimeter or something, am I right?
Either way, why not just putting the points on the pin?
Best regards, guys!
