ADC Oversample with Scan - sanity check question

I just want to double check something before I optimise an implementation.

If burst is enabled on multiple channels, let's say x256 for two channels, internally is the process doing:

Read first channels x256 times then read second channels x256 times

or

Read first channel, Read second channel, repeat 256 times

The documentation suggests it is the prior method however the implementation under-the-hood would give the same outcome just with the reads being done in or out of order.

docs.nordicsemi.com/.../saadc.html

(Obviously I can just use the scan feature and am doing so but it's a memory hog.)

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