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How does the SAADC "Scan" mode use the "BURST=1"

Section "37.5.3 Oversampling" in the nRF52832 Product Specification v1.2 says that "Oversampling and scan should not be combined" but then later it says "Scan mode can be combined with BURST=1, if burst is enabled on all channels".

If I read the document correctly, "BURST" depends on the "OVERSAMPLE" setting to get it's number of samples. So it seems that when "Scan" mode is used with the "BURST" enabled that there is actually Oversampling done in this way. Is this correct?

I have noticed that in the "nrf_drv_saadc" code that if more then one channel is selected during channel initialization (which is required to enable Scan mode) that the OVERSAMPLE must be disabled. So from this it seems you cannot use the BURST when Scanning?

Also noticed the the "burst" config setting is not available in the "SDK 11.0.0" but is in the "SDK 13.0.0"

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