dtm rf test from bootloader

[tim]

I am attempting run the rf test from the bootloader. But I have the following problems.

When I try to compile the dtm rf test into the bootloader I run out of space.

Possible solutions include

1. compacting the bootloader and placing the dtm test into the bootloader This is not really practical give that well will need to add another sensor jig test as well.

2. In bootloader sense whether pins pulled low by the test jig when present.

a) Launching the application firmware and again sense whether pins pulled low. Performing dtm test or sensor jig test infinite loops before the normal application.

b) Launch the dtm test or sensor jig test by jumping to an separate code region.

I would think that Launching the application firmware and running the dtm test or sensor jig test from there should work. But I don't seem to enter the test loops as expected. If this should work I can provide a code example.

[John]

If you really need the DTM test in the bootloader couldn't you just allocate more space for the bootloader project configuration?

That said, the way we enter DTM mode is that our application FW checks a pin at the beginning of initialization. If it is pulled low we enter the DTM, if not we boot our normal application much like you suggest above.

[tim]

I did not know how to add more space for the bootloader project.

Can you point me to documentation or an example how to configure and add more space to the bootloader project. Also what are the limitations on how much space can be added to the bootloader project.