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nRF51822 QFAA H30 fails production test

Hi,

We have used nRF51822 QFAA H10 in our product for a long time but the latest order was fulfilled with H30-devices and now our production test fails.

The test step is verifying a speaker by producing a tone with PWM (Timer with CC, GPIOTE and PPI) and the new H30 devices don't sound correct (haven't received any faulty units yet). We have a workaround in code for PAN73:

static __INLINE void pan73_workaround_activate(uint8_t timer)
{
    // nRF51822 rev3 silicon (H0) needs workaround when using PPI with GPIOTE
    
    uint8_t rev = (NRF_FICR->CONFIGID & 0xF0) >> 4;
    if (rev == 7 || rev == 8 || rev == 9) {
        if (timer == 0) {
            *(uint32_t *)0x40008C0C = 1;
        } else if (timer == 1) {
            *(uint32_t *)0x40009C0C = 1;
        } else if (timer == 2) {
            *(uint32_t *)0x4000AC0C = 1;
        }
    }
}

Are there any changes in H30 compared to H10 that could cause issues? This is a legacy code base with SDK 4.4.2 and S110 5.2.1.

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