Are there any plans to add boundary scan functionality to assist ICT testing? If not, are there any other hooks into the part that can be used to test during ICT?
Are there any plans to add boundary scan functionality to assist ICT testing? If not, are there any other hooks into the part that can be used to test during ICT?
I'm not sure if I understand what you have in mind. What kind of tests would you like to do?
I would like to exercise the i/o pins of the device without programming the device. With the assembled board on an ICT machine I can then verify connectivity of the NRFR51 with the rest of the board. Usually JTAG boundary scan is used to control devices such as Microcontrollers and FPGAs to assist with automated testing in manufacturing.
No, we don't have any such functionality available on the nRF51. You would have to program it. It's flash based, so you could re-program them as well.