Hi. I'm using nRF52832, SDK13.0.0.
The roll is peripheral.
And I'm using Oberon to use ECDH.
I think you have the result or document for random generator's performance based on Shannon or NIST or DieHard tests.
Could you please let me know your result?
I'm sure that bias enable is enabed as below.
in sdk_config.h
#ifndef RNG_ENABLED
#define RNG_ENABLED 1
#endif
#if RNG_ENABLED
#ifndef RNG_CONFIG_ERROR_CORRECTION
#define RNG_CONFIG_ERROR_CORRECTION 1
#endif
#ifndef RNG_CONFIG_POOL_SIZE
#define RNG_CONFIG_POOL_SIZE 32
#endif
in C file
uint8_t rng_tester(uint8_t * p_buff, uint8_t size)
{
uint32_t err_code;
uint8_t available;
nrf_drv_rng_bytes_available(&available);
uint8_t length = MIN(size, available);
err_code = nrf_drv_rng_rand(p_buff, length);
APP_ERROR_CHECK(err_code);
return length;
}
void test_rng(void)
{
unsigned int cnt_l = 100000;
SEGGER_RTT_printf_log(0, RTT_CTRL_TEXT_WHITE"type: d\n");
SEGGER_RTT_printf_log(0, RTT_CTRL_TEXT_WHITE"count: %d\n", cnt_l);
SEGGER_RTT_printf_log(0, RTT_CTRL_TEXT_WHITE"numbit: 32\n");
unsigned char test_buf[4];
for(int i = 0; i <cnt_l ; i++)
{
rng_tester(test_buf, 4);
int result_l = (test_buf[0] | (test_buf[1] << 8) | (test_buf[2] << 16) | (test_buf[3] << 24));
nrf_delay_ms(10);
SEGGER_RTT_printf_log(0, RTT_CTRL_TEXT_WHITE"%d\n", result_l);
}
}
int main(void)
{
......
test_rng();
while(1)
{
;
}
}
I'm getting TXT file using RTT log.
txt file is
type: d
count: 100000
numbit: 32
142607036
-289465569
716407500
-889941776
1929543548
-240293617
-2144713292
1976024794
459320735
-1330035274
-28695444
1250428465
......
I'm attaching txt file.rng_20190918_007.txt
