Hello, the nRF5340's SAADC has a temperature dependent offset according to the product specification. The offset can be measured (I suppose it is automatically applied within the SAADC) via the TASKS_CALIBRATEOFFSET task.
I could not find any information about the calibration time in the product specification (v1.5). Did I overlook it or search in the wrong place? There is information about acquision time and conversion time, but not about offset calibration time.
Is there any information available? If it is already in the product specification, please let me know where. Otherwise, please let me know here and if possible, include it in the product specification (also for the nRF54 series). This information is important for modelling the delays in real-time systems during a re-calibration cycle.
Is the offset calibration time static or is it dynamic with a worst case upper limit?
One more short question regarding the input voltage. Is it safe to apply voltages that exceed the full-scale reference voltage to an analog input pin? E.g. internal reference voltage and gain are set to 2.4V, and 3.0V are applied at the pin. My understanding from the Absolute Maximum Ratings section would be that this scenario is physically safe for the SoC (AIN pins have same limits as other pins).
Best regards,
Michael