DTM test, poor sensitivity problem

Hi,

  Our client has about the hardware design of nrf52805. There is a big difference in sensitivity between the boards of the front and back batches of pDTM test, poor sensitivity problematches (PCB is the same batch), and it has been determined that the matching network should be selected according to the recommended value of the chip (device package is 0201).

The first batch was -96dBm.The second batch was -93~-94dBm.And the first batch of sub-boards has been worn out, difficult to cross-test verification,The customer wants to know if there is any data and report on RF test environment and process of nrf52805. These cannot be obtained from the chip manual. If so, please help to provide them.

Best regards,

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